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Transmission electron microscope and scanning electron microscope

Transmission electron microscope and scanning electron microscope

Experiment introduction

Transmission electron microscope (transmission electron microscope, TSE) uses transmission electron imaging, so the thickness of the sample must not exceed 100nm. Its structure includes three parts: electronics system, vacuum system and electron optical system.

Scanning electron microscopy (SEM) uses a focused, very thin, high-energy electron beam to scan on the sample to excite various physical information. Through the acceptance, magnification and display imaging of this information, the observation of the surface topography of the test sample is obtained. Its structure consists of a vacuum system, an electron beam system and an imaging system.

Hengyuan Bio has many years of experience in electron microscopy services, and can provide customers with various types of samples of electron microscopy testing technical services.

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